http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006349550-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5d7576285d411d00c697e07270d2814a
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2005-06-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_df25cf7579b2fcb9b05b78afa727498d
publicationDate 2006-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2006349550-A
titleOfInvention Semiconductor measuring equipment
abstract PROBLEM TO BE SOLVED: To improve measurement accuracy of a measuring apparatus using a mercury probe. A vacuum evacuation groove 2, a vacuum measurement groove 3, and electrode grooves 4, 5 are provided on the surface of a stage 1 in this order from the outside. A vacuum pump is connected to the evacuation groove 2, a vacuum gauge 23 is connected to the vacuum measurement groove 3, and pipes 4 a and 5 a that can supply mercury are connected to the electrode grooves 4 and 5, respectively. By adopting such a configuration, it is possible to match the degree of vacuum measured by the vacuum gauge 23 with the effective degree of vacuum inside the electrode grooves 4 and 5 when evacuating with a vacuum pump. it can. Thereby, the effective degree of vacuum can be accurately controlled, and the area of the electrode formed on the wafer 31 can be made constant. Therefore, measurement accuracy can be improved. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2014027193-A
priorityDate 2005-06-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419556032
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23931

Total number of triples: 14.