http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006242771-A
Outgoing Links
Predicate | Object |
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assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9a177f0fa84b1b2134e13caa36974ce3 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M11-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M11-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-457 |
filingDate | 2005-03-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8bf4ba5f5b3180a57a7fdc2552fa8347 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_455f6654ec3af81fbfbf65c4f2a0fa0f |
publicationDate | 2006-09-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2006242771-A |
titleOfInvention | Optical characteristic measuring apparatus, optical characteristic measuring method, program used therefor, and recording medium |
abstract | PROBLEM TO BE SOLVED: To provide an optical characteristic measuring apparatus and method capable of performing measurement in an environment with large fluctuations and temperature changes regardless of the type of measurement object, having a wide measurement frequency range and high measurement accuracy. . An optical characteristic measuring apparatus includes a nonlinear optical crystal that generates a photon pair A and B and emits the photon A to an optical element 4, and an optical delay circuit that changes an optical path difference between the photon A and the photon B. 6 and photons A and B are transmitted and reflected, and the reflection component of photon A and the transmission component of photon B are mixed and guided to photon detector 7A, and the transmission component of photon A and the reflection component of photon B are mixed The beam splitter 5 that leads to the photon detector 7B, the coincidence device 8 that measures the frequency at which photons are simultaneously detected by the photon detectors 7A and 7B as a coincidence rate, and the optical path difference from the measured coincidence rate. And an analyzer 9 that calculates a change in the coincidence rate with respect to the change and calculates the wavelength dependence of the optical characteristic value of the optical element 4 based on the value of the dip portion in the change in the coincidence rate. [Selection] Figure 1 |
isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109270083-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109270083-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2023054744-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109272099-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-101889192-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2529498-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103712779-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2021117632-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022070395-A1 |
priorityDate | 2005-03-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 26.