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filingDate 2005-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f05f4476f2768cef0ec42847efb06844
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publicationDate 2006-08-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2006226734-A
titleOfInvention Determination of embrittlement temperature of frozen specimens using dielectric properties
abstract PROBLEM TO BE SOLVED: To provide a method for non-destructively determining an embrittlement temperature optimum for processing a frozen specimen. The method for determining the embrittlement temperature of an object according to the present invention is based on the relationship between the capacitance relaxation end temperature and the relaxation time and the relationship between the embrittlement temperature and the strain time following an Arrhenius type equation. Then, the measurement result of the electrostatic capacitance is converted into the embrittlement temperature according to the formulas (1) and (2). [Selection] Figure 4
priorityDate 2005-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 31.