http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006196592-A

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Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_be055db3c1a09879df07379ba969e223
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-56
filingDate 2005-01-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b9c47f5a61e9bb27bb494a0c2601fd51
publicationDate 2006-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2006196592-A
titleOfInvention Inspection method for resin-encapsulated semiconductor device
abstract There is provided a method for inspecting a resin-encapsulated semiconductor device in which a chip sandwiched between a plurality of chips can be taken out in a state where electrical analysis can be performed without damaging the chip. The surface of the electronic component package is polished with a polishing paper or the like until the electronic element 3 above the electronic element to be analyzed is exposed. In this state, hydrofluoric acid and nitric acid are in a 3 to 1 ratio. The exposed electronic element 3 is dissolved and removed using a hydrofluoric acid etching solution mixed in a ratio or a potassium hydroxide aqueous solution. Thereafter, the whole is immersed in a fuming nitric acid etching solution heated to around 70 ° C. for about 10 minutes, and the electronic element protection resin 6, the resin internal wire wiring 4, and the chip adhesive tape 7 are removed. Thereafter, ultrasonic water washing is performed to expose the clean surface of the surface of the electronic element 3 sandwiched between the plurality of chips so that electrical analysis can be performed. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114420602-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105301475-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114420602-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2016063194-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-105723502-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2016046995-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111370340-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103940831-A
priorityDate 2005-01-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 25.