http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006194670-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cebc9740ef706cde29e885504f274ffa |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-225 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B11-06 |
| filingDate | 2005-01-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cdddd9d6795d4a16f1a82ca2bdba82dc http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_55b7c44eb6397669046d488a64e99b0d |
| publicationDate | 2006-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2006194670-A |
| titleOfInvention | Inspection method of primer forming surface |
| abstract | PROBLEM TO BE SOLVED: To provide a primer forming surface inspection method capable of quantitatively quantifying the thickness of a compatible layer formed at an interface between a resin base material and a primer layer without using a special apparatus. A brightness profile on a straight line perpendicular to the interface is obtained from an image of a cross section near the interface between a resin substrate and a primer layer formed on the surface, and the slope of the brightness profile in a resin substrate region E is obtained. Is formed at the interface between the resin base material and the primer from the interval J between the inflection point I where the temperature changes on the primer layer side and the inflection point H where the slope of the luminance profile in the primer layer region D changes on the resin base material side. A method for inspecting a primer forming surface to obtain the thickness of the compatible layer. [Selection] Figure 2 |
| priorityDate | 2005-01-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 33.