http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006128355-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1af8df51ce24ca931ae718fb747f6aa0
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76898
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-52
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205
filingDate 2004-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9dd0c963c213be90566874b011f27edb
publicationDate 2006-05-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2006128355-A
titleOfInvention Silicon semiconductor substrate
abstract Provided is a silicon semiconductor substrate capable of ensuring electrical insulation even when a conductive film is formed on the inner surface of an electrodeposited film and electrical connection is made on the front and back surfaces of the substrate. A metal film is formed at an edge portion of a through hole, and a silicon semiconductor substrate is formed by forming an electrodeposition film on the inner surface of the through hole including the edge portion. Here, the electrodeposition film is an insulating film formed in the through hole. Also, a conductive film is formed on the inner surface of the electrodeposition film formed in the through hole. Further, the inner diameter of the through hole is 50 μm to 150 μm. According to the present invention, an insulating film with good insulation can be formed by using an electrodeposition technique even on the inner surface of a very fine through-hole provided in a silicon semiconductor substrate. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2013072525-A3
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priorityDate 2004-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 21.