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filingDate 2004-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_35dffb8910926eac76dce9827834d095
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publicationDate 2006-03-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2006058259-A
titleOfInvention Semiconductor device
abstract 【Task】 Provided is a semiconductor device in which a large number of test-dedicated terminals and the like can be easily provided without increasing the package area, and the function can be switched without changing the package. [Solution] The actual use terminal 201 used in the normal operation state and the test dedicated terminal 202 used when the LSI inspection or the like is performed have a pitch narrower than the minimum pitch that can be mounted by soldering, and 1 The function switching circuit included in the LSI chip 100 is arranged as a pair of terminals, and the actual use terminal 201 and the test dedicated terminal 202 can be input, output, input / output, or It is set to any state in which no input is accepted and nothing is output. [Selection] Figure 1
priorityDate 2004-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 22.