http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005345163-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b576861ef2bbff1956483170b6360884 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23C2-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B15-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-225 |
| filingDate | 2004-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c35cbe29a2bfac2013e84f550e9ec8f1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ec5df9c2eeada7e45cf0b64d409b6738 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8d80e0066f8201dafda5e502bd813583 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aed8700fdebcf93a0c1f64ecb3ee7354 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_78a6ab732d81d488bd47976cb640c9d4 |
| publicationDate | 2005-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2005345163-A |
| titleOfInvention | Method for measuring the thickness of the surface oxide film of galvanized steel sheet |
| abstract | PROBLEM TO BE SOLVED To provide a technique for measuring a thickness of an oxide film having a thickness of 10 nm to 100 nm formed on a surface layer of a zinc-based plated steel sheet quickly and with high accuracy. Moreover, the main objective is to evaluate the press formability of a plated steel sheet provided with the measured oxide film thickness. SOLUTION: Using a scanning electron microscope equipped with an electron beam microanalyzer or a wavelength dispersion type X-ray detector, an electron beam accelerated to 3 to 6 kV is irradiated on the surface of a zinc-based plated steel sheet, and oxygen generated thereby Oxidation formed on the surface of a zinc-based plated steel sheet, which eliminates the influence of the secondary line of the zinc L-line by measuring the intensity of the Kα-line through a detector and a wave height analyzer at the subsequent stage. Method for measuring film thickness. [Selection] Figure 1 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2007034572-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1867949-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-1867949-A4 |
| priorityDate | 2004-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 36.