http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005233810-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5d7576285d411d00c697e07270d2814a |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2004-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b259b06ed7c56b86ce86485ed597468e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_42ad9554e321d95093ab7be2e4575c2c |
| publicationDate | 2005-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2005233810-A |
| titleOfInvention | Measuring device for electronic parts |
| abstract | PROBLEM TO BE SOLVED: To provide a measuring device for an electronic component by efficiently providing a measured electronic component having a plurality of electrode patterns in a short time by providing a contact portion having the same pattern as the electrode pattern formed on the measured electronic component on the bottom surface. An object of the present invention is to obtain a measuring apparatus for electronic parts that can be measured by the above method. In a measuring apparatus for electronic parts according to the present invention, a fixing seat for fixing an electronic part to be measured, and a bottom surface having the same pattern as an electrode pattern formed on the electronic part to be measured. A contact portion that makes contact with each other, a contact confirmation portion that determines a contact state between the pattern formed on the bottom surface of the contact portion and the electrode pattern, a pressure adjustment portion that applies pressure to the contact surface between the bottom surface of the contact portion and the electrode pattern, When the electrical characteristics of the electronic component to be measured are measured, the bottom surface of the contact portion on which the pattern is formed makes surface contact with the electronic component to be measured on which the electrode pattern is formed. [Selection] Figure 3 |
| priorityDate | 2004-02-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985 |
Total number of triples: 13.