| abstract |
A gamma ray imaging apparatus having high energy resolution and high position resolution is provided. A Compton camera is configured by arranging two flat electrode split germanium semiconductor detectors 11 and 12 in front and rear, and detection signals obtained at the anode and cathode of the flat electrode split germanium semiconductor detector are obtained. It is possible to measure how deep the gamma ray interaction has occurred from the detector surface with respect to the thickness direction of the detector, and with respect to the direction parallel to the electrode surface of the detector, The working position can be measured with high accuracy. This improves the spatial resolution by solving the Compton scattering kinematics more accurately. [Selection] Figure 1 |