http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005195600-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c16d2144a81bfa32a665dca1e93c3d37 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F16L11-12 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F16L11-042 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31924 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/F16L58-1054 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-316 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
| filingDate | 2005-01-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_412bc8c7ed9e0e13acbc4ad24a163a0f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6f122dc0cd7dab1a19a2a747ae925db7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4ebb2dbcf6c69ff67161b85382e4335e |
| publicationDate | 2005-07-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2005195600-A |
| titleOfInvention | Apparatus for generating a test stimulus signal having a current source independent of internal impedance changes of the device under test |
| abstract | PROBLEM TO BE SOLVED: To provide a device for generating a test stimulus signal having a current source which is not related to a change in internal impedance of a device under test. A test stimulus signal generator comprising a voltage source generator and a V / I converter. The voltage source generator converts the source data stored in the internal memory into an analog signal, and synthesizes the analog signal and a DC voltage level reference signal to generate a voltage source test stimulus signal. The V / I converter converts the voltage source test stimulus signal into a current source test stimulus signal and outputs it to the input pin of the device under test. The V / I converter holds the current of the current source test stimulus signal at a set value regardless of changes in the internal impedance value present at the input pin of the device under test. The test stimulus signal generation device according to the present invention can generate a test stimulus signal having a current source that is not related to the internal impedance change of the device under test, and can accurately test the operation performance of the device under test. [Selection] Figure 3 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111308299-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111308299-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103885417-A |
| priorityDate | 2004-01-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID449577181 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID54891 |
Total number of triples: 25.