http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005189179-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b576861ef2bbff1956483170b6360884
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T5-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N15-02
filingDate 2003-12-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e463e0863a958a28668328fb009c8109
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_03e60437b6f2571f569ca56430478266
publicationDate 2005-07-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2005189179-A
titleOfInvention Particle size measurement method
abstract It is an object of the present invention to provide a particle size distribution measuring method for a granular material capable of accurately obtaining a variation in particle size from a captured image. An image is estimated by probabilistically optimizing an evaluation function composed of a plurality of constraint conditions on a pre-processed image obtained by subjecting a captured original image to filtering processing and binarization processing. To do. In this process, the pixel variable of the target pixel is approximated by calculation from the variable assigned to the neighboring pixel, and further, the correction of the active pixel and the non-active pixel is adjusted by adjusting the range of the neighboring region that represents the neighboring pixel. An estimated image is obtained with a bias. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-115629043-A
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017083348-A
priorityDate 2003-12-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 28.