http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005134271-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_db496c7f79f0dfbca146c6a7100e0992 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2003-10-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c37b10efab42d0260dbd3759f2a77d9f |
| publicationDate | 2005-05-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2005134271-A |
| titleOfInvention | Probe needle |
| abstract | PROBLEM TO BE SOLVED: To cause a probe needle tip to be contaminated with an adhering matter even after repeated measurements, resulting in a short circuit failure due to the falling of an electrically conductive adhering matter or a contact failure due to an insulating adhering matter. It is to provide a probe needle that does not have the risk of being damaged. A probe needle of the present invention has a rounded portion at a tip, a wire guide main body 104 that supports a wire 103 wound around the rounded portion so as not to come off from the rounded portion, and is wound around the rounded portion. A conductive wire 103 that slides along the rounded portion and a wire drive mechanism 105 that slides the wire 103 along the rounded portion are provided. [Selection] Figure 1 |
| priorityDate | 2003-10-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 15.