http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005127961-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9ec030fc062b270c25327af9127bed3a
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01R33-76
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2003-10-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_eec0d57619b265a2d410abd10d021ad7
publicationDate 2005-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2005127961-A
titleOfInvention Test board and test apparatus using the same
abstract PROBLEM TO BE SOLVED: To provide a test substrate for inspecting a semiconductor package or a chip, which has a simple structure, a low manufacturing cost, and can cope with an increase in the number of pins. SOLUTION: A plurality of insulating substrates (10) and a plurality of protrusions having thin protrusions at the tips, which are formed by wire bonding on one surface of the insulating substrate and are arranged corresponding to the arrangement of bumps or terminals (14) to be inspected. Ball bump (16), a plurality of microsprings (22) arranged on the other surface of the insulating substrate, and from one surface of the insulating substrate to the other surface to electrically connect each ball bump and microspring. And a conductive via (24) penetrating therethrough. [Selection] Figure 2
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008243459-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4494429-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008533441-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007080592-A
priorityDate 2003-10-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123
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Total number of triples: 18.