http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005085316-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36d1d9c59848bff6ad5f55923d1290f5
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-115
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8247
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C16-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C16-02
filingDate 2003-09-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_994081e64ce6e1b78fc36572b6073ae3
publicationDate 2005-03-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2005085316-A
titleOfInvention Nonvolatile semiconductor memory
abstract PROBLEM TO BE SOLVED: To prevent malfunction due to deterioration of element characteristics of a nonvolatile memory cell. A plurality of non-volatile memory cells (MC) that store information in a rewritable manner as threshold voltage differences, a bit line (BL) connected to a data terminal of the non-volatile memory cell, and a bit line A selection circuit (7) capable of selecting a plurality of shared memory cells in parallel, and the parallel writing and reading of the same data can be performed in units of bit lines for the plurality of memory cells selected in parallel by the selection circuit. To be. By selecting a plurality of memory cells that share a bit line in parallel, the current flowing in the bit line in the read operation increases approximately to the number of memory cells selected in parallel, and the characteristics of the memory cell deteriorate. In addition, it is possible to suppress or alleviate the situation in which the potential change is delayed in the bit line during the read operation, and this prevents malfunction due to deterioration of element characteristics of the nonvolatile memory cell. [Selection] Figure 1
priorityDate 2003-09-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID176015

Total number of triples: 16.