http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005079597-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_60480587582bf8e0ca64c6076c0646ab |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10T436-25 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2001-045 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-2258 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-04 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-677 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-225 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-00 |
| filingDate | 2004-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b91f468d6515496f87bbc91ebcae2ce1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c50bba21394cfc6ff965659808175bc3 |
| publicationDate | 2005-03-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2005079597-A |
| titleOfInvention | Method for quickly using a focused beam device to extract a sample for analysis from a workpiece |
| abstract | PROBLEM TO BE SOLVED: To provide a method for rapidly using a focused beam apparatus for extracting a sample for analysis from a workpiece. A method for rapidly using a focused beam device (38) to extract a sample (44) for analysis from a workpiece (18) includes a conditional chamber (36) of the focused beam device (38). ) To insert the workpiece (18) through the workpiece port (26), and extract the sample (44) from the workpiece (18) using the focused beam device (38) for at least a portion. The sample (44) is removed via the sample removal path (46, 48) that does not pass through the workpiece port (26), and thereby the sample is extracted without interfering with the flow of the workpiece to be extracted. Enabling removal of a sample from the focused beam device. [Selection] Figure 2 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015092156-A |
| priorityDate | 2003-09-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID105145 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID415810586 |
Total number of triples: 22.