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filingDate 2004-09-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f7537daaff37cd40327915679fa6ded1
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publicationDate 2005-01-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2005017307-A
titleOfInvention Dew point measuring apparatus and measuring method thereof
abstract In a dew point measurement method using attenuation of propagating light in an optical waveguide, even at a temperature of −35 ° C. or lower, high-sensitivity detection is performed by using the same rapid attenuation of propagating light as that at higher temperature. Of dew point measurement method and measurement device [Solution] Propagation light that is introduced into the optical waveguide core from the light source and propagates in the core adheres to the core surface due to the action of frost or dew that adheres to the surface of the optical waveguide where the optical waveguide is at the same temperature as the surrounding gas or at a lower temperature. In a dew point measuring device that detects by using attenuation caused by scattering by frost or dew, frost or dew nuclei are formed on the surface in order to make uniform and fine frost or dew easily adhere to the surface of the optical waveguide. The dew point measuring device is characterized in that a surface treatment is performed. [Selection figure] None
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2017213118-A1
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