http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2004519675-A
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318544 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318536 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3183 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
| filingDate | 2002-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2004-07-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2004519675-A |
| titleOfInvention | Test methods for testable electronic devices |
| abstract | A method for testing a testable electronic device having a first and second plurality of test arrays, eg, a scan chain, is disclosed. By using the first shift register (110) in parallel with the second shift register (130), the first test vector (102) and the second test vector (104) can be divided into a plurality of test vectors (102a-c, 104a-c), corresponding to the first and second plurality of test sequences. By changing the size of the first shift register (110) and the second shift register (130), the trade-off between the number of contact pins of the electronic device and the required test time can be adjusted. Preferably, the first shift register (110) is connected to the first buffer register (120), and the second shift register (130) is connected to the second buffer register (140) to store the test data. Improve stability. The first shift register (110) and the second shift register (130) may be large shift registers, for example, partitions of a boundary scan chain. This method can also be used in the reverse direction to time multiplex the test result vectors into a single vector at the output of the testable electronic device. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010032507-A |
| priorityDate | 2001-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 35.