http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2004253440-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6bfdf49224a405be1f7b653c56ebad94
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-812
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-778
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-338
filingDate 2003-02-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d901ef23866a83cfea947fb91ae6cb0c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_97c1e3ef4085fe66822044e06acad7db
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publicationDate 2004-09-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2004253440-A
titleOfInvention Field effect transistor and method of manufacturing the same
abstract An object of the present invention is to provide a field effect transistor having improved mobility especially at room temperature as compared with a conventional field effect transistor. In a field effect transistor having a buffer layer, an electron transit layer, a spacer layer and an electron donating layer on a compound semiconductor substrate, the field effect transistor is grown at a temperature lower than the growth temperature of the spacer layer. obtain. At this time, examples of the material of each layer include those in which the substrate is made of InP, the buffer layer is made of AlInAs, the electron transit layer is made of InP or GaInAs, the spacer layer is made of AlInAs, and the electron donating layer is made of AlInAs. [Selection diagram] Fig. 1
priorityDate 2003-02-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 20.