http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2004221448-A

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filingDate 2003-01-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_884fe9334a399cd8bbb6b40e8076ea40
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publicationDate 2004-08-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2004221448-A
titleOfInvention Nonvolatile semiconductor memory device and method of manufacturing the same
abstract A non-volatile semiconductor memory device capable of improving the charge retention characteristics of a silicon nitride film forming a charge storage layer and a method of manufacturing the same are provided. Data retention characteristics are improved by using a silicon nitride film having a Si—H bond density of 1 × 10 19 cm −3 or less as a charge storage layer 4 of a nonvolatile memory such as an MNOS memory or a MONOS memory. . In order to form this silicon nitride film, an LPCVD method using silicon tetrachloride (SiCl 4 ) and ammonia (NH 3 ) as source gases can be suitably used. [Selection diagram] Fig. 1
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