| abstract |
Provided is a method and an apparatus for inspecting a shape defect of a strip, which can inspect both a shape defect larger than the thickness of the light band and a shape defect having a size approximately equal to the thickness of the light band by using a low-cost apparatus. . A belt-like body surface is irradiated with band-like light IL traversing the belt-like body 1 to form a light band LB on the belt-like body surface, and a reflection image RI of the light band LB reflected by the band-like body surface is projected on a screen 15, and the screen is formed. 15 is imaged by the two-dimensional imaging device 20 to detect a shape defect larger than the thickness of the light band due to the bending of the light band LB. A shape defect having a size of is detected. [Selection diagram] Fig. 1 |