http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2004170263-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7820eb060b017f856ba2ce4646fb12c4
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
filingDate 2002-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4f23c91f4ed1ed5e4da5ecff89dce870
publicationDate 2004-06-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2004170263-A
titleOfInvention Probe card cleaning tool and cleaning method for probe card
abstract An object of the present invention is to provide a cleaning tool and a cleaning method which can prevent insufficient cleaning and excessive cleaning of a stylus of a probe card and can perform cleaning of a stylus in a short time. A cleaning tool (5) for cleaning a stylus (4a) of a probe card (4) in a prober itself or a polishing surface (5a) thereof is formed of a conductive polishing material, for example, tungsten carbide. Therefore, by using the cleaning tool 5, the cleaning operation of the stylus and the contact check operation of checking the electrical continuity of the stylus can be performed in parallel. [Selection diagram] Fig. 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102928761-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015170627-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100797318-B1
priorityDate 2002-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419526597
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID2724274

Total number of triples: 17.