http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2004144859-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_be92719b856db86c092cc233e9512ca2 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-952 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03G5-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03G21-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03G5-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03G15-00 |
| filingDate | 2002-10-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_43b00aff439bc1bfb1172aadca45659b |
| publicationDate | 2004-05-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2004144859-A |
| titleOfInvention | Component evaluation method for electrophotographic image forming apparatus, evaluation apparatus thereof, electrophotographic photoreceptor whose surface is evaluated, and image forming apparatus using the same |
| abstract | An object of the present invention is to make it possible to correct unevenness in illuminance of illumination that constitutes an evaluation device, decrease in peripheral light amount in a lens, uneven light amount due to an optical system, and unevenness in sensitivity of a measurement sensor. To provide an evaluation method and an evaluation device for detecting an object with high accuracy. A part for an electrophotographic image forming apparatus is used as an object to be evaluated, and the surface is optically measured by a one-dimensional line sensor or a two-dimensional sensor while rotating the object to be evaluated so as to correspond to the surface of the substrate to be evaluated. Two-dimensional image data to be created, two-dimensional multi-resolution analysis of the two-dimensional image data is performed to obtain low-frequency component image data and high-frequency component image data, and further included in the low-frequency image data and the high-frequency image data. A method for evaluating the surface of a component for an electrophotographic image forming apparatus, wherein the evaluation is performed on the surface of an evaluation object by correcting unevenness derived from the appearing evaluation apparatus. [Selection diagram] Fig. 4 |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7893394-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011008254-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-108645735-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006251314-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8597863-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009229391-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4508910-B2 |
| priorityDate | 2002-10-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 67.