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filingDate 2002-07-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4774b2db4efbc76cf4bd14a760ad0fd8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2f2450d75715913a2e9e6efe4d49bf27
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publicationDate 2004-02-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2004061826-A
titleOfInvention Photoconductor sensitivity distribution measuring apparatus and photoconductor sensitivity distribution measuring method
abstract An object of the present invention is to easily measure the sensitivity of a photosensitive member without being affected by noise over the entire visualized area. Noise data in which pixels having optical information exceeding a threshold are linearly continuous from image data of an image obtained by visualizing an electrostatic latent image obtained by uniformly exposing and scanning a uniformly charged photoconductor surface. The average value obtained by averaging the optical information of a plurality of pixels including an arbitrary pixel of interest in the image data along the continuous direction in step S5 is subtracted from the optical information of all the pixels in step S6, and the resulting value is exposed. I got it as body sensitivity. This makes it possible to acquire, as the sensitivity of the photoconductor, optical information from which the influence of noise having directionality has been removed without being caused by the surface state of the photoconductor. [Selection diagram] FIG.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005308709-A
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011028588-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015166820-A
priorityDate 2002-07-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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