Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5d7576285d411d00c697e07270d2814a http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3a8a9c815fc8478d3e08d53d4dd6cd87 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66462 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28575 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-425 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66318 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66863 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-42316 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-285 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-812 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-027 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-335 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-423 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-331 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-338 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-42 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-40 |
filingDate |
2003-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_86f6da9ed2af80206788d8bd6d77b3a3 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7e925a9789a878fc69e5e81a1b93926e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b49f7504bc8979a500d628aab1d151af |
publicationDate |
2004-01-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-2004004569-A |
titleOfInvention |
Method for manufacturing compound semiconductor device |
abstract |
A method for manufacturing a compound semiconductor device having an asherless process is provided. In a method of manufacturing a compound semiconductor device having a lift-off step, the lift-off step includes forming a resist mask having an electrode opening on an active layer of the compound semiconductor formed on the substrate of the compound semiconductor. Forming a metal layer on the resist mask and on the active layer in the electrode opening; and dissolving the resist mask and removing the metal layer formed on the resist mask to form an active layer in the electrode opening. And an exfoliation step including an exfoliation step in which an electrode is formed by leaving a metal layer on the layer, wherein the exfoliation step comprises exfoliation mainly comprising one or more compounds selected from the group consisting of amine compounds and nitrogen-containing cyclic compounds. The step of removing the resist mask to the extent that it is not necessary to remove the residue of the resist mask by ashing using the liquid. [Selection diagram] Fig. 1 |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012015232-A |
priorityDate |
2002-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |