http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003506680-A

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filingDate 2000-07-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2003-02-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2003506680-A
titleOfInvention Method and apparatus for simultaneously measuring multiple properties of a multilayer film
abstract (57) [Summary] The present invention relates to a method and an apparatus for simultaneously measuring a number of properties of a sample comprising a multilayer film. This measurement is represented by several steps. First, at least one excitation radiation source illuminates the surface of the sample to excite an acoustic mode. A probe source of radiation illuminates an acoustic mode that is diffracted from the surface of the sample to form a signal beam. The detector detects an acoustic mode to generate a signal beam, and the signal beam is analyzed to determine an acoustic frequency and amplitude, a modulation depth, or an attenuation constant. These properties are further analyzed to determine at least two properties of the sample (eg, the thickness of the two layers).
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Total number of triples: 25.