Predicate |
Object |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31905 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2851 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2889 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-22 |
filingDate |
2000-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2003-01-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-2003503712-A |
titleOfInvention |
Semiconductor parallel tester |
abstract |
(57) [Summary] A semiconductor parallel tester for simultaneously inspecting a plurality of DUTs fixed to a handling device is disclosed. The test system includes a system controller that initializes a system test signal and a pin electronics assembly responsive to the system test signal that generates a test pattern signal for sending to a plurality of DUTs. The system further includes a signal interface defining a plurality of direct signal paths between the handling device and the pin electronics assembly. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-WO2007080644-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007502434-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4488438-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102520852-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7458837-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102215404-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20200042414-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007093279-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2007080644-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006343182-A |
priorityDate |
1999-06-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |