http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003270245-A
Outgoing Links
Predicate | Object |
---|---|
assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b19eaa8e535da4e4bceed99917a68153 |
classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-53 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C12M1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N37-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C40B50-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C40B40-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C12N15-09 |
filingDate | 2002-03-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e19f001ace343a02366b01f5549dc8df http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_59102adb7bb02cdf63fbceed63f19fe4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e5b7921608c53454b294600344e81c06 |
publicationDate | 2003-09-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber | JP-2003270245-A |
titleOfInvention | Microchip substrate |
abstract | (57) [Problem] To provide a microchip substrate in which a sample fixing surface is not deformed due to uneven force applied from a substrate fixing jig of a measuring device. SOLUTION: Means for limiting the contact surface of the measuring device with the substrate fixing jig is provided on the back surface of the sample fixing surface, and preferably, the means for limiting the contact surface is a projection on a part of the back surface of the sample fixing surface. Preferably, the convex portion is an outer edge portion that is thicker than the thickness of the sample fixing surface. The material of the substrate is preferably a saturated cyclic polyolefin. |
priorityDate | 2002-03-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.