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publicationDate 2003-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2003258096-A
titleOfInvention Wiring structure and method of forming the same
abstract (57) [Summary] (Problem corrected) [PROBLEMS] To form a wiring using an easily diffusible conductive material on an insulating film represented by Cu by using a damascene method, while suppressing a wiring delay and forming a wiring. An effective dielectric constant of an insulating film to be filled is significantly reduced to realize a highly reliable wiring structure corresponding to recent miniaturization of a semiconductor element. SOLUTION: Via holes 2 and wiring grooves 3 are formed by a damascene method. After forming the wiring 4 to be filled with Cu via the base film 6 to fill with Si, when forming the SiC: H film 5 so as to cover the upper surface of the wiring 4, the film density of the SiC: H film 5 is 2.1. (G / cm 3 ) or more so that the N atom content is increased from 8 (atm%) to 20 (atm %).
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