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filingDate 2001-12-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a66db3821426369cd4ac82a9c5246b5b
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publicationDate 2003-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2003195531-A
titleOfInvention Electrophotographic photosensitive member defect detection method and apparatus
abstract (57) Abstract: A non-destructive inspection method and apparatus capable of detecting a defect of an electrophotographic photosensitive member without destroying a defect on the electrophotographic photosensitive member is provided. In a method for detecting a defect of an electrophotographic photosensitive member, a charged particle having conductive particles as a main component and a charged particle carrier having a conductive and elastic surface carrying the charged particles are provided. The charged particle carrier is brought into contact with the electrophotographic photosensitive member in a state where the charged particles are interposed, and the electron is passed through the charged particle carrier using the constant current power supply 105. A constant current is applied to the photoconductor, and a defect of the electrophotographic photoconductor is detected based on a voltage change of a constant current power supply.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2020086383-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-7171395-B2
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