http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003161742-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
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filingDate 2001-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2a59c9c156c125c294981423f522d3cd
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publicationDate 2003-06-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2003161742-A
titleOfInvention Silicon probe card and method for manufacturing the same
abstract (57) [Summary] [PROBLEMS] The position of each inspection terminal made of needle-like crystals arranged at an extremely small pitch can be reliably determined by photographing with a camera, and the position of the electrode pad and each inspection terminal is determined. Provided are a silicon probe card capable of performing alignment automatically and a method of manufacturing the same. A surface of a Si substrate is covered with an insulating surface, and a conductive film forming surface having the same pattern as a wiring pattern and an alignment mark are formed on the insulating surface. The needle-like crystal 4 is formed, and the conductive film forming surface 3, the needle-like crystal 4, and the alignment mark 20 are selectively plated on the insulating surface 2. While forming the film, the alignment mark 20 Is coated with a metal coating 21 having a reflectance different from that of the insulating surface.
priorityDate 2001-11-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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