Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_294881271413951a95f284b588a68e66 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-092 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-822 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8238 |
filingDate |
2001-08-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1589d983933156ea42bbd8b7f8173d24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ef075ed1b230442e476bc17c3a17649b |
publicationDate |
2003-03-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-2003078018-A |
titleOfInvention |
Semiconductor device |
abstract |
(57) Abstract: A semiconductor device capable of recovering from deterioration of transistor characteristics due to NBTI or the like is provided. A monitor circuit monitors a characteristic of a transistor to which a predetermined voltage is applied to a gate electrode, a temperature increasing circuit increasing a temperature of the transistor, and a characteristic of the transistor monitored by the monitor circuit. A control circuit for operating the temperature raising circuit when the deterioration of the transistor characteristics is equal to or more than a predetermined threshold value. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2012056574-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2014509786-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-5408362-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9054699-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2011041280-A |
priorityDate |
2001-08-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |