http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003045830-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B24B37-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B24B37-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-304
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C08F290-06
filingDate 2001-08-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_865bd20b79f7b65f266780d8f3729475
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e6661cc4dd35f682735057b2f02a4d1c
publicationDate 2003-02-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2003045830-A
titleOfInvention Polishing pad for semiconductor, polishing apparatus using the same, and method for manufacturing semiconductor device using the same
abstract PROBLEM TO BE SOLVED: To provide a polishing pad used for flattening a surface of a semiconductor wafer by a CMP polishing method, wherein a projection on the surface of the wafer is made uniform in a plane without causing scratches and cracks on the wafer surface. A polishing pad for flattening is formed. SOLUTION: A photopolymer composition containing a compound obtained by reacting a hydroxyl group-containing compound with a monoisocyanate and subjecting to urethane treatment is prepared, and the composition is formed into a sheet and then cured by light or heat.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010058220-A
priorityDate 2001-08-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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