http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003035724-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c1755eede76ea7e719a3e0d2843cd793 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01R11-01 |
| filingDate | 2001-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dd420a2ac2aa07a7e0331137f7124fe4 |
| publicationDate | 2003-02-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2003035724-A |
| titleOfInvention | Continuity inspection probe card and continuity inspection method |
| abstract | PROBLEM TO BE SOLVED: To provide a highly reliable continuity test probe card and a continuity test method in a continuity test of an electronic circuit device, in which there is no leak between adjacent electrodes and no continuity failure occurs even if the test is repeated. I will provide a. A continuity test probe card including a wiring board and a continuity test portion, wherein the probe in the continuity test portion is a conductive fine particle, and the conductive fine particle has a thickness in a core made of a high molecular weight material. A metal layer having a thickness of 0.3 μm or more, a recovery rate at 10% compression deformation at 20 ° C. of 10% or more, an aspect ratio of less than 1.5, and a CV value of 10% or less; A continuity inspection probe card in which conductive fine particles are adhered and fixed with an electrically insulating adhesive in a state where the conductive fine particles are in close contact with the electrodes of the wiring substrate to such an extent that a compression deformation of 2 to 30% occurs. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007171078-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4584140-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11732105-B2 |
| priorityDate | 2001-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.