http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2003021663-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5547f741b25666fc4ae5195cf71a979b |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2001-07-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_020615761455b4896cd42f01ad1a6b4d |
| publicationDate | 2003-01-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2003021663-A |
| titleOfInvention | MMIC test method |
| abstract | [PROBLEMS] To eliminate the need for mounting and bonding by brazing an MMIC chip and a chip capacitor to a base plate, and to enable RF measurement in a short time. A needle probe has a structure that contacts at least two points of an electrode pad for power supply of an RF sample and an upper surface electrode of a chip capacitor. The needle probe is connected to the electrode pad and the chip capacitor. By simultaneously contacting the top electrode of Supply power and perform predetermined RF bypass to perform predetermined RF Perform the test. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10309987-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104237769-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-104237769-A |
| priorityDate | 2001-07-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 20.