http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002334579-A

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C7-22
filingDate 2002-04-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5ff7d5e7780e0e6d1084d2472ad2ba49
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publicationDate 2002-11-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2002334579-A
titleOfInvention Method and apparatus for reducing write operation time in dynamic random access memory
abstract PROBLEM TO BE SOLVED: To provide a method for improving write time for a dynamic random access memory (DRAM) having a destructive read architecture. A method for preparing a dynamic random access memory (DRAM) cell for a write operation having a preset state is disclosed. In one exemplary embodiment, the method includes creating a preset voltage level in the cell prior to a delayed write back in the destructive read architecture, wherein the preset voltage level is a logic zero voltage level. And a logic 1 voltage level. A logic 0 voltage level corresponds to the first cell voltage value when the cell stores 0 bits therein, and a logic 1 voltage level corresponds to the second cell voltage value when the cell stores 1 bit therein. I do. Prior to creating a preset voltage level in the cell, the cell has an initial voltage value corresponding to either a logic zero voltage level or a logic one voltage level.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6937535-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-RE42976-E
priorityDate 2001-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 21.