http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002280548-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-265
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78
filingDate 2001-03-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a3322c7e63ae7bcf8ce21e9d57ac8f60
publicationDate 2002-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2002280548-A
titleOfInvention Method for manufacturing field effect semiconductor device
abstract (57) Abstract: A method of manufacturing a field-effect semiconductor device, which employs simple means so that a source region or a drain region can be subjected to impurity activation heat treatment by applying an absorber film process. Impurity activation at the channel-side tip of the region or the drain region is sufficiently performed to reduce the parasitic resistance. SOLUTION: Ion implantation for forming a source extension region 15 and a drain extension region 16 is performed on a surface of a silicon semiconductor substrate 11 on a surface of a silicon semiconductor substrate 11 with a gate electrode 13 having a side wall 14 formed as a mask, being separated from both sides in a channel direction of the gate electrode. After removing the side walls, an absorber film made of an insulating film 17 and a metal film 18 covering the whole including the gate electrode 13 is formed, and the absorber film is irradiated with a laser beam to form the source extension region 15 and the drain. Laser annealing the extension region 16;
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-100426464-C
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9548205-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2004109783-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7932185-B2
priorityDate 2001-03-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2001068669-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2004509466-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000236091-A
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Total number of triples: 26.