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filingDate 2001-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_951f3cc6581ad06938cb56332b863299
publicationDate 2002-05-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2002158152-A
titleOfInvention Ceramic heater for semiconductor manufacturing and inspection
abstract (57) [Summary] [PROBLEMS] To reduce uneven temperature around through holes such as insertion holes, vacuum suction holes, etc., to protect wafers from thermal shock, and to control temperature components such as thermocouples and temperature fuses. To provide a ceramic heater with improved controllability. Further, it is an object of the present invention to provide a ceramic heater for manufacturing and inspecting semiconductors capable of uniformly curing a resin. A heating element is provided on the surface or inside of a ceramic substrate. The insertion hole 1 of the ceramic substrate 12 6, corners of the concave portion 18, the vacuum suction hole 20 and the like are chamfered.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2018181841-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2018022724-A
priorityDate 1999-11-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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