http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002107315-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0950e9df7f0e1b73efee1bda859951ad |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-36 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-223 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 |
| filingDate | 2000-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e35f220e9ac31669b6d2171f530bda5e |
| publicationDate | 2002-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2002107315-A |
| titleOfInvention | Method for measuring silica concentration in pure water |
| abstract | (57) [Summary] [PROBLEMS] To provide a method capable of easily and highly sensitively measuring and evaluating the silica concentration in pure water, and accurately and easily determining the ion exchange resin replacement time and the like. . SOLUTION: The method of measuring the silica concentration in pure water according to the present invention comprises the steps of: dropping a pure water sample on a substrate made of a material whose fluorescent X-ray spectrum does not interfere with Si; Evaporating to dryness, irradiating the surface of the aggregate on the substrate with primary X-rays to measure a fluorescent X-ray spectrum, and analyzing the measured fluorescent X-ray spectrum, Determining the concentration of Si in the substance, and calculating the concentration of silica (SiO 2 ) contained in the pure water sample from the obtained value. |
| priorityDate | 2000-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.