| abstract |
(57) [Summary] H provided with a configuration for simultaneously measuring a plurality of DUTs In the case of FIX, each HIFIX itself has a HIFIX A means for providing information on application conditions is provided. Provided is a semiconductor test apparatus capable of performing test management corresponding to IFIX. A HIFIX is provided with HIFIX application conditions for identifying each type of HIFIX to be mounted as coded setting information, and can read the HIFIX application conditions. A semiconductor test apparatus comprising: an X application condition acquisition unit, wherein an operation condition corresponding to the HIFIX is set for a semiconductor test device main body and an IC handler device based on a code value obtained from the HIFIX application condition acquisition unit. |