| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5d7576285d411d00c697e07270d2814a |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-16225 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L24-81 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-60 |
| filingDate |
2001-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_43b54f957a7232d83fb2a43989598591
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21511c6fc4ee0fc8834308899cff96da
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d16a51e7ae8ecda1ae7b8de343e691ba
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8c6fac62cd429e85b4a42e036bcf4bf3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f7b2f4c93a88b4c847b2095053410fcf
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_38ede6e53d08cb651f26b2a409882ed8 |
| publicationDate |
2002-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-2002071752-A |
| titleOfInvention |
Method of testing semiconductor device, test substrate thereof, and method of manufacturing test substrate |
| abstract |
(57) [Summary] [PROBLEMS] To simplify a test process and reduce a test cost. SOLUTION: A burn-in test of a semiconductor element 3 is performed in a state where a protruding electrode 12 of a test substrate 10 and an electric connection electrode 3a of the semiconductor element 3 are joined by heating and pressurizing. When the element 3 is peeled off from the test substrate 10, the protruding electrode 12 is peeled off from the test substrate 10 along with the semiconductor element 3, and the protruding electrode 12 is formed on the semiconductor element 3. The formation of the protruding electrodes 12 on the element 3 is performed simultaneously. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101188975-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007534947-A |
| priorityDate |
2001-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |