http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002071556-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9df90d7822cc480ce12c480f4089e229 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-553 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-543 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-41 |
| filingDate | 2000-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0356cdf2ae3afd61723fef27a09d63da http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a4f02fd57ff45f937e129a8623e2457a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_80af3d121903032f614790a729adfc8b |
| publicationDate | 2002-03-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2002071556-A |
| titleOfInvention | Surface analysis method |
| abstract | (57) [Summary] [Problem] A method capable of detecting a change in a vertical direction of about 0.1 nm to several 100 nm in a short time in a range of several cm square, and measuring it in a solution. An incident angle at which surface plasmon resonance (SPR) does not occur. The reflected light from the sample is imaged with a two-dimensional photodetector at three or more wavelengths, the reflected light image is measured, the average luminance value of the entire image at each wavelength is calculated, and each wavelength is determined based on the maximum average value among the average values. The average value is normalized to obtain a background data for each wavelength, and the reflected light from the sample is imaged by the same photodetector at three or more wavelengths at which the data is measured at an incident angle at which SPR occurs. The brightness of each pixel is corrected by the data, and the brightness of each pixel after correction at all wavelengths is stored in the memory of the computer until the end of the measurement at the required wavelength. A surface analysis method that calculates the SPR wavelength at each pixel of the reflected light image by calculating the minimum wavelength of luminance at each pixel of the image by approximating with a polynomial. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8462344-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009082353-A1 |
| priorityDate | 2000-09-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.