http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002040146-A

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filingDate 2000-07-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_46d7a1f02db56384bb2e634098a667a9
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publicationDate 2002-02-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2002040146-A
titleOfInvention Radiation intensity analyzer by energy, medium, and information aggregate
abstract (57) [Summary] [Problem] Conventionally, intensity analysis by X-ray energy cannot be performed. SOLUTION: When a X-ray is absorbed, a plate-shaped photoelectric conversion material 1 which generates an amount of electrons and holes according to the energy of the X-ray, and a planar counter electrode sandwiching the photoelectric conversion material 1 are provided. A voltage applying means for applying a voltage to the photoelectric conversion material 1 via the counter electrode 2 and the extracting electrode 3; a control means for controlling the magnitude of the voltage applied by the voltage applying means; Detecting means for detecting the amount of electrons or holes generated in the conversion material 1 reaching the counter electrode 2 or the extraction electrode 3; and electrons detected by the detecting means for each of a plurality of voltages applied by the voltage applying means. Alternatively, an analysis unit for analyzing the intensity of each of a plurality of energy regions of the X-rays incident on the photoelectric conversion material 1 based on the amount of holes is provided.
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