| Predicate |
Object |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-6441
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-278 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6458
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12Q1-6869
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-04 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C12Q1-68
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C12N15-09
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C12M1-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N33-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C12Q1-6869 |
| filingDate |
1998-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate |
2001-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
JP-2001509612-A |
| titleOfInvention |
Wavefield microscopy, wavefield microscopy, wavefield microscopy for DNA sequence determination, and calibration method for wavefield microscopy |
| abstract |
(57) [Summary]nThe present invention relates to two new wavefield microscope types I and II. These microscopes each have an excitation and illumination system, which comprises at least one real and virtual illumination source and at least one objective lens (for Type II) or two objective lenses (for Type I). Case). Here, the illumination source and the objective lens are arranged relative to each other as follows. That is, they are arranged so as to be suitable for forming one two-dimensional or three-dimensional standing wave field in the target space. The calibration method of the present invention is adapted to this wavefield microscope and can measure the geometric spacing between fluorescent dye-marked target structures, which spacing is the main maximum of the effective point spread function. May be smaller than the half value width of. The invention further relates to a method for wavefield microscopy DNA sequencing. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-WO2004090517-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-112009005521-B4
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007089828-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2004090517-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008014689-A |
| priorityDate |
1997-07-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |