http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2001337110-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a0a316ab43a02eff238683857aa650f6
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
filingDate 2000-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_89ce4f642b4a35fc091a92c94fa38501
publicationDate 2001-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2001337110-A
titleOfInvention Probe pins and probe cards
abstract PROBLEM TO BE SOLVED: To provide a probe pin for a probe card which has excellent spring characteristics and does not increase the contact resistance over time, and a highly reliable probe card. SOLUTION: A probe pin is a clad wire whose inside is made of a noble metal or an alloy thereof and whose outer peripheral portion is made of a metal having good spring characteristics. The probe pins are used for a probe card.
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2007017955-A1
priorityDate 2000-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 35.