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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
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filingDate 2000-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3e9014cc8c04e2e73f9f4f0c9f21532e
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publicationDate 2001-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2001230244-A
titleOfInvention Method of forming insulating film and multilayer wiring
abstract (57) Abstract: A method for efficiently growing a wiring interlayer insulating film having high heat resistance and CMP resistance in forming a low dielectric constant polymer film on a semiconductor substrate. SOLUTION: Divinylsiloxane bisbenzocyclobutene monomer is vaporized by a vaporization controller 6, introduced into a reaction chamber 11, and heated to 350 ° C. or more in a low power plasma of 0.2 W / cm 2 or less. Plasma-polymerized divinylsiloxane-bis-benzocyclobutene is grown on the substrate 14 so that a benzocyclobutene film having high heat resistance can be efficiently formed. In the early stage of the growth, a plasma-polymerized divinylsiloxane / bis-benzocyclobutene film having a relatively small dielectric constant is grown at a low growth pressure, and then the growth pressure is increased to obtain a dense plasma-polymerized divinylsiloxane / bis-benzocyclobutene film. By continuously growing butene film, the mechanical strength of the film surface is enhanced and CM Ensure P tolerance.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2005223012-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7968471-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2007221165-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8823079-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2004095865-A
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type http://data.epo.org/linked-data/def/patent/Publication

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