http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2001208772-A

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filingDate 2000-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3189ba366add0c56804e0c0569872a6a
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publicationDate 2001-08-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2001208772-A
titleOfInvention Interconnect high-density test connector for integrated circuit testing.
abstract (57) [Summary] [Problem] To ensure a substantially constant supporting force regardless of the extension of the end of a pin, and even if the contact surface has poor flatness, Ensure the same bearing force for all pins. A plate for supporting a plurality of conductor pins, one end of which forms a contact area with an integrated circuit to be tested, and the other end of which has a contact area with connection means for connection with a test device. Is formed with a connection plate, and the conductor pins are shaped to ensure flexibility with longitudinal components, and are interconnected high-density test connectors for integrated circuit testing, The pin has a series of at least three parts (4,5,6) that are curved in alternating directions, extended on both sides by a linear segment that is movable with a certain degree of freedom with respect to axial movement, the pin comprising It is characterized by being inserted into a plate.
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priorityDate 1999-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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