http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2001174508-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2859d6c8d8bdf6161978c81498e20d7f |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1999-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0eff95e63f3a16f9a3eb7a7d95e6e595 |
| publicationDate | 2001-06-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2001174508-A |
| titleOfInvention | Integrated circuit mounting board for integrated circuit life test |
| abstract | (57) [Summary] An object of the present invention is to provide an integrated circuit mounting board for an integrated circuit life test that can withstand high temperatures and is fragile and does not break. A terminal 1a of a socket 1 to which a pin terminal T provided in an integrated circuit IC is inserted and connected is used to test the life of a thin film wiring forming an integrated circuit. The socket 1 is brought into contact with one end 4a of a large number of wirings 4 formed on the insulating film 3 and And the other ends 4b of a large number of wirings 4 formed on the insulating coating 3 on the surface of the metal plate 2 are formed so as to be able to be inserted and projected from the inner surface of the door 10 of the constant temperature bath 9 whose temperature can be varied. The metal plate 2 protruding from the outer surface of the door 10 The other end 4b of a large number of wirings 4 formed on the insulating film 3 Is an integrated circuit mounting board for an integrated circuit life test configured to be inserted and connected to a cable socket 7 connected to an end of a cable 6 connected to a life tester 5. |
| priorityDate | 1999-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 14.