http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2001099885-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ae0e62912b4f8e65239da2b2d65a54cf http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_80787665b837ed3eb503bbcd27c0043a |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 1999-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9347dcfd4edb33f8c86ae1b490ee66fd |
| publicationDate | 2001-04-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-2001099885-A |
| titleOfInvention | Hybrid IC evaluation test equipment for deuterium discharge tubes |
| abstract | (57) [Summary] [PROBLEMS] In the prior art, it was not possible to judge non-defective products and defective products of a hybrid IC only by measuring the lamp intensity after energizing the printed circuit board. Therefore, the failure of the hybrid IC is a failure of the entire printed circuit board. A dedicated hybrid IC evaluation test apparatus is provided which can confirm that a discharge current after a discharge discharge of a D2 lamp is within a predetermined range and is provided with a mechanism capable of easily replacing a single hybrid IC. In the production of hybrid ICs, it is very difficult to eliminate defects in a single unit to zero. By using this evaluation test apparatus, defective products can be extracted and productivity and reliability can be improved. |
| priorityDate | 1999-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559591 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID167583 |
Total number of triples: 13.