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filingDate 2000-07-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_546ed722a40bc193af2f103ca65a97dc
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publicationDate 2001-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2001085425-A
titleOfInvention Manufacturing method of dielectric film
abstract PROBLEM TO BE SOLVED: To enable formation of a ferroelectric film at a substrate temperature of 400 ° C. or less, to enable use of an electrostatic chuck, and to remove unnecessary films formed on the back surface of the substrate. Reduce the number of processes. SOLUTION: A first group consisting of an organic Bi compound, a second group consisting of an organic Sr compound, a third group consisting of an organic Ti compound, and a fourth group consisting of an organic Ta compound and an organic Nb compound. At least one organometallic compound is selected from each group of the group and mixed to a predetermined composition to generate a reaction gas. An oxide film is formed on the substrate 10 by introducing the mixed gas into a reaction chamber (not shown) in which the substrate 10 maintained at a temperature of 00 ° C. or less is installed and performing chemical vapor deposition using plasma energy. Then, the oxide film is heat-treated in an oxidizing atmosphere to obtain Sr x Bi y (Ta, N b) forming a 2.0 Ti z O w film 16.
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